In this paper, a novel built-in sensor (BIS) for digital CMOS circuit testing has been proposed. The proposed BIS has no voltage degradation and it is able to detect, identify and localize both open and short circuit faults. Moreover, it has a simple realization with very small area and detection time. A 4×4 multiplier cell is tested by the proposed BIS and all injected faults are detected. © 2009 IEEE.
Analog fault diagnosis by inverse problem technique
A novel algorithm for detecting soft faults in linear analog circuits based on the inverse problem concept is proposed. The proposed approach utilizes optimization techniques with the aid of sensitivity analysis. The main contribution of this work is to apply the inverse problem technique to estimate the actual parameter values of the tested circuit and so, to detect and diagnose single fault in analog circuits. The validation of the algorithm is illustrated through applying it to Sallen-Key second order band pass filter and the results show that the detecting percentage efficiency was 100% and also, the maximum error percentage of estimating the parameter values is 0.7%. This technique can be applied to any other linear circuit and it also can be extended to be applied to non-linear circuits. © 2011 IEEE.
Analog fault diagnosis and testing by inverse problem technique
A novel algorithm for detecting soft faults in linear analog circuits based on the inverse problem concept is proposed
Built-in Current Sensor for testing Current Feedback Operational Amplifier
This paper presents novel Built In Sensor (BIS) to test a well-known analog building block, the Current Feedback Operational Amplifier (CFOA)
Memristor-based pulse width modulator circuit
This paper discusses the use of the memristor in one of the most important modulation techniques in communication field namely the pulse-width modulation