Abstract
This paper presents novel Built In Sensor (BIS) to test a well-known analog building block, the Current Feedback Operational Amplifier (CFOA). The proposed BIS tests on the terminal characteristics of the analog block. It has no voltage degradation. Moreover, it has a simple design, very small area and can detect both short and open circuit faults. Simulations are made to test CFOA-based universal analog filter. A comparison with the conventional IDDQ test is given and it proves that the proposed BIS has a superior performance. © 2009 IEEE.
Authors
Ahmed R.F., Madian A.H., Radwan A.G., Soliman A.M.
Document Type
Confrence Paper
Source
Proceedings of the International Conference on Microelectronics, ICM, Art. No. 5696155, PP. 339 to 342, Doi: 10.1109/ICM.2010.5696155