Abstract
In this paper, a novel built-in sensor (BIS) for digital CMOS circuit testing has been proposed. The proposed BIS has no voltage degradation and it is able to detect, identify and localize both open and short circuit faults. Moreover, it has a simple realization with very small area and detection time. A 4×4 multiplier cell is tested by the proposed BIS and all injected faults are detected. © 2009 IEEE.
Authors
Ahmed R.F., Radwan A.G., Madian A.H., Soliman A.M.
Document Type
Source
Proceedings of the International Conference on Microelectronics, ICM, Doi:10.1109/ICM.2010.5696137